• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    Holder (100, 200) for holding an electron microscope sample carrier (310), which has a base plate (101) with an opening (103) extending through a central region of the base plate (101) and a bearing surface (107) at least partially surrounding the opening (103). for the sample carrier (310), wherein on the base plate (101) a holding device (104a, 104b) for frictionally holding the sample carrier (310) on the support surface (107) is provided, the holding device (104a, 104b) for frictionally holding the Sample carrier (310) comprises at least two mutually independent clamping elements (104a, 104b) which extend from the base plate (101) to the opening (103) and by means of which spaced edge regions (313a, 313b) of the electron microscope specimen carrier (310) on the support surface (310). 107) are durable. The invention further comprises a loading device for loading a holder with an electron microscope sample carrier and a method for using the loading device.
    公开号:AT510799A1
    申请号:T1986/2010
    申请日:2010-11-29
    公开日:2012-06-15
    发明作者:Leander Gaechter
    申请人:Leica Microsystems Schweiz Ag；
    IPC主号:
    专利说明:

    P11920
    Holder for an electron microscope sample carrier
    The invention relates to a socket for holding an electron microscope sample carrier, which has a base plate with a in a central region of the base plate extending through this opening and an opening at least partially encircling support surface for the sample carrier, wherein on the base plate a holding device for non-positive holding of the sample carrier the support surface is provided.
    The invention further relates to a loading device and a method for loading a socket according to the invention with an electron microscope sample carrier.
    The invention further relates to a specimen holding device for an electron microscope comprising a socket according to the invention.
    The power of electron microscopy, especially high-resolution transmission electron microscopy, is remarkable. Thanks to this technology, great progress has been made in researching and acquiring information in the investigation of, for example, biological ultrastructures or semiconductor structures.
    Due to the high vacuum prevailing in the transmission electron microscope (TEM) and the electron-rich electron beam, a sample preparation which preserves the structure is usually required. In particular, this is the case with biological samples. For a high-resolution transmission electron micrograph, it is furthermore imperative that the sample is sufficiently thin. TEM samples are applied to appropriate slides for examination. Typically, these are very small, round, filigree grids with a diameter of 2 to 3 mm. The meshes have variously shaped holes (honeycombs, slits, etc.) or a mesh of defined mesh number. The nets are usually coated with a thin film and may also have further coatings.
    For the examination in the electron microscope, the sample carrier with the sample on it must be fixed in a suitable preparation holder device. In most applications, the specimen holder device is realized as a goniometer, mainly using side-entry goniometers. In one-piece specimen holder devices, the specimen carrier is inserted into an aperture of the specimen holder device and fixed there. Alternatively, multipart preparation holder devices are increasingly used, as described, for example, in EP 1 868 225 A1 and EP 1 947 675 A1. In these multi-part devices, the sample holder is first fixed in a frame-like frame, also referred to as a cartridge, and the frame is then reversibly fastened in a corresponding holder of the preparation holder device. EM specimen holder devices must meet specific requirements.
    In addition to highest mechanical stability and high vacuum capability, the fixation and storage of a sample carrier in the specimen holder device is of particular relevance due to the filigree nature of the sample carriers used. For a trouble-free examination and to avoid the loss of the sample carrier, the sample carrier must be fixed stably and vibration-free. Furthermore, tensions of the filigree sample carrier should be avoided, as this is otherwise easily destroyed. In the known specimen holder devices, as have become known, for example, from EP 1947 675 A1 and US Pat. No. 6,002,136, the netting is held in the aperture of the specimen holder device by means of a securing ring. This circlip is usually pressed with a tool, which adversely affects the coating of the sample carrier. These coatings are typically very brittle and can easily be damaged by distortion during assembly of the sample carrier and the locking ring. Furthermore, the circlips are small elements that are cumbersome to handle and easily lost, especially when they need to be loaded into the mounting tool. For many applications, a highly precise and stable tilting of the preparation is provided around one or more axes lying in the plane of the preparation. For example, WO 00/10191 describes a double-tipped Sidc-Entry specimen holding device. With the above-described construction using a snap ring, the potential of such applications can not be fully exploited disadvantageously. Retaining rings require a groove to press the sample carrier onto the annular support in the aperture. The snap ring and the groove require an annular structure that is slightly smaller than the mesh diameter. This leads to a limitation of the tilt angle and consequently to a lower information gain from the electron microscopic observation. For certain electron microscopic applications, it is necessary for the sample to be transferable from the sample preparation device to the TEM, and for good thermal contact between the EM preparation holder devices and the sample. * * M Mft * fti PI1920 * I * I * i * « • * is «4 ♦ ·« «« «· * ·« ·· «tl« * · -3-. This is essential especially in cryo-electron microscopic applications in structural biology. In this technology, a water-containing sample is cryofied, i. it is cooled very quickly, avoiding the formation of ice crystals. The objects to be examined, for example cells, enzymes, viruses or lipid layers, are thereby embedded in a thin vitrified ice layer. The transfer of the cryofixed sample means critical handling and contamination possibilities. For this purpose, specially cooled EM specimen holder devices or sockets are used, which allow the transfer of a cryofixed sample.
    It is therefore an object of the invention to eliminate the above-mentioned disadvantages of the prior art and moreover to provide a socket which meets the high requirements described above. Consequently, a version for an electron microscope sample carrier is to be provided with which a stable, tension-free fixation of the sample carrier is possible, so that the sample carrier is not adversely affected by the sample. Furthermore, a good thermal contact between the socket and the sample carrier should be ensured. In addition, the version should allow the largest possible tilt angle.
    This object is achieved with a version of the type mentioned, in which according to the invention the holding device for non-positive holding of the sample carrier comprises at least two mutually independent clamping elements which extend from the base plate to the opening and by means of which spaced-apart edge regions of the electron microscope sample carrier on the support surface are durable.
    Thanks to the invention, a stable and stress-free fixation of the sample carrier is possible. Compared to the circlip known from the prior art, the sample carrier is kept free of stress. The assembly is much easier and a distortion of the sample carrier during assembly is avoided. As a result, the risk of destroying the sample carrier and the samples thereon is kept very small.
    Despite the stress-free fixation of the sample holder in the socket, there is good thermal contact between the socket and the sample holder. This is particularly important for preparations in which a certain temperature level must be maintained during the examination.
    Compared to the design using a circlip, the invention allows in-1920 Π1920 tt · *** ·· Μ * • ·· «· · · ·« »
    • * · · < «T I # ι t *« «·« »t» · · · · · · M | The present version a larger tilt angle, since no annular groove or no annular fastener is provided.
    Another advantage is the simple structure and ease of use of the version, since it can be dispensed with small, lost and cumbersome to handle parts. Thanks to the invention, sample carriers can not only be easily inserted, but also just as easily removed from the holder without damaging them.
    Furthermore, it has been found that the version according to the invention can be produced cost-effectively. For example, it may also be made as a single use product.
    The version according to the invention is suitably made of high vacuum suitable materials. High vacuum grade materials should not contain any water molecules or lead, furthermore they should not have a porous surface. Preferred materials are copper and beryllium copper,
    The version according to the invention is primarily intended to be received by an electron microscope specimen holder device. Preferably, the specimen holder device is realized as a goniometer, wherein a realization in the form of a side-entry goniometer is particularly preferred. The functioning and the basic structure of a goniometer or a side-entry goniometer are well known to the person skilled in the art. The version according to the invention is receivable and releasably securable in a corresponding holder of the specimen holder device or of the goniometer. For example, EP 1 947 675 A1 describes a specimen holder device which has two parallel holding rods; the handrails engage in a groove running around the outer edge of the socket. In EP 1 868 225 A1, the socket is fastened in the specimen holder device by means of a snap mechanism.
    Consequently, the invention also relates to a specimen holding device for an electron microscope, which comprises a releasably aufnhmmbare socket according to the invention. For many applications, a high-precision and stable tilting of the preparation around one or more axes lying in the plane of the preparation is necessary. Consequently, it is advantageous if the version according to the invention is tiltably mounted in the specimen holder device about at least one axis lying in the sample support plane, preferably about two axes lying in the specimen support plane. Such tilting mechanisms are from the state of PI 1920 m. ! • »« ♦ »· * · · · · · ♦ * · · | ·· ** ··· ··· ··· -5-
    Technique known and described for example in WO 00/10191.
    Another advantage of the version at this point is to mention the transferability of the version, in particular the transferability of the sample preparation device, such as a cryochamber for preparing samples for cryoelectron microscopy, in an electron microscope. The version according to the invention is particularly suitable for use in transmission electron microscopy, in particular in cryo-transmission electron microscopy.
    The socket is designed to be suitable for holding standard electron microscope slides. For this purpose, the dimensions of the opening in the base plate, the support surface for the sample carrier and the clamping elements are adapted to the respective sample carrier in the production of the version. Typically, such sample carriers have a standard size. As used herein, " sample carrier " refers to all carriers known to a person skilled in the art and suitable for electron microscopy and for electron-microscopic sample preparation. In particular, the term " sample carrier " to the already mentioned grids (" mesh ", " mesh ", " mesh "), the grids having variously shaped holes (honeycombs, slits, etc.) or a mesh of defined mesh number and / or with a film coated (eg Coated Grids from Quantifoil) and / or may be carbon-coated. The diameter of standard grids is typically 2 to 3 mm.
    Instead of the term " version " In the following, the term " cartridge " used with the same meaning.
    According to the invention, the socket may comprise two or more clip elements. Preferably, the socket comprises two to three clip elements. In a particularly preferred embodiment, the holding device comprises exactly two clamping elements. On the one hand, this is the simplest construction and on the other hand, a stable and stress-free mounting and storage of the sample carrier is possible for trouble-free electron microscopic observation. In addition, a very good thermal contact is ensured. Since the sample carrier is held only on 2wei edge areas in the socket, a large tilt angle is possible. For example, a sample surface with a diameter of 2 mm can be viewed at an angle of 70 ° in the electron microscope (0 ° means perpendicular to the sample). For a stable holding of the sample carrier in the socket, the clip elements are preferably arranged opposite each other in this embodiment. PI 1920 tt · * «* * * ··· * * * * * *» *· * * * I · I ···· * Φ · · Φ · · · · «φ * · φ * φ + * · · · · -6-
    A particularly gentle and tension-free holding the sample carrier in the socket results when the clip elements are strip-shaped (tongue-shaped) and arranged substantially parallel to the base plate. Of course, it is also possible for the clip elements to have a wire-shaped design with a round cross-section, but the strip-shaped configuration is preferred for the reasons stated above.
    In a particularly preferred and easy to implement embodiment, the clip elements are designed as spring elements. The sample carrier is held by spring force with bias in the direction of the base or the support surface. Preferably, the spring element is strip-shaped {tongue-shaped) as described above.
    Expediently, each clamping element has a first end fixed to the base plate and a second end oriented towards the opening for frictionally holding the sample carrier on the support surface. The first end of the clamping element is preferably fixed by a spot weld on the base.
    Preferably, the second end of the clip member closes with the edge of the support surface at the opening. The sample carrier is held particularly securely in the socket, since the entire width of the support surface is utilized, and on the other hand, the second end of the clamping element does not extend into the opening in the base, thereby permitting an imperfect passage of the electron beam.
    It is particularly advantageous if the socket has a cover plate arranged on the base plate, wherein the cover plate has an open area in a middle area, which enables access to the sample carrier and to the clip elements. The open area in the access to the sample carrier is preferably designed so that the sample carrier can be fitted in this area. This facilitates the orientation of the sample carrier in the socket. With regard to access to the Klammcrelementen the open area in the cover plate is designed so that the clamping elements for inserting the sample carrier can be manipulated.
    In an advantageous embodiment, the first end of each clamping element is fixed between the base plate and the cover plate. The second end of each clamp element is located in the open area of the cover plate and therefore accessible. This gives a very compact and easy to manipulate version. Base plate, clamp elements and cover plate are preferably connected to each other by spot welding. The central region of the cover plate essentially corresponds to the middle region PI 1920
    the base plate. In this composed of two plates version, the upper cover plate is formed correspondingly elastic to allow welding to the base plate.
    In a further advantageous embodiment, the socket has an intermediate plate arranged between the base plate and the cover plate, wherein the clip elements are components of the intermediate plate. The intermediate plate has an open area in a central area, which preferably corresponds substantially to the open area of the cover plate, wherein the clamping elements extend into the open area. In this composed of three plates socket, the intermediate plate is preferably formed integrally with the clamping elements, wherein the thickness of the intermediate plate preferably corresponds to the thickness of the clip elements. For a gentle and handy mounting of the sample holder in the socket, it is for practical reasons advantageous if the open area in the cover plate has a size that allows eccentric insertion of the sample carrier, the sample carrier next to the position in which the sample carrier in the holder is durable, in the socket einleg-bar and then in the position in which the sample carrier in the holder is durable, laterally displaceable. In embodiments in which an intermediate plate is used, the open area of the intermediate plate corresponds again, as mentioned above, essentially to the open area of the cover plate, so that access to the support surface or to the sample carrier is ensured. The clip elements extend into the open area. For certain electron microscopic applications, the socket has an outer edge with a rotationally symmetrical design, in particular corresponding to a four-count rotational symmetry. Preferably, the version is essentially polygonal, in particular square
    In a further embodiment, the socket has a substantially round outer edge. For many applications, a high-precision and stable tilting of the preparation around one or more axes lying in the plane of the preparation is necessary. Below " substantially round " is an outer edge to understand, which is preferably circular. The outer edge may also be oval. A round outer edge is particularly advantageous when the socket is in a so-called " double-tilt goniometer " is used. Double-tilt goniometers are well known to those skilled in the art. For example, WO 00/10191 describes such a double-tilted side-entry specimen holder. Accordingly, the invention also relates to double-tilt goniometers, pi 1920 :::: • «« · * · * · ·· * φ · · · Φ · · * # ·· * -8- have a version according to the invention. For the mounting of the sample carrier in the socket, it is provided in a preferred embodiment that is arranged below each staple an extending through the base plate opening therethrough. The clip elements can be lifted by means of engaging elements which are inserted from below through the opening. After inserting the sample carrier this is held by removing the tool and lowering the clip elements in their original position in the socket. A charging device for mounting the sample carrier in the socket and the mounting method will be described in detail below and below in FIGS. 4 to 7.
    The invention further relates to a loading device for loading a socket with an electron microscope sample carrier, comprising: a socket according to the invention, in which an opening extending through the base plate is arranged below each staple element, and a loading auxiliary element into which the socket can be inserted wherein the loading auxiliary member has engagement members which extend through the apertures located below each clip member in the base plate of the socket and which move the clip members of the socket against their holding force in a direction away from the base plate.
    The arranged on the loading auxiliary element engaging elements are preferably formed pin-shaped. The loading auxiliary element is preferably formed block-shaped and has for easier orientation of the socket when inserting a recess which corresponds to the outer shape of the socket. This makes it possible to orient the openings arranged in the base plate of the socket correctly to the engagement elements arranged on the loading auxiliary element.
    The invention further relates to a method for loading a socket with an electron microscopic sample carrier by means of a loading device as described above, comprising the steps of: a) inserting the socket in the loading auxiliary element, b) moving the clamp elements by means of the engaging elements of the loading auxiliary element in F1192U * 1 9 Λ ·
    Μ9 ·
    C) placing the sample carrier on the support surface of the socket, and d) removing the socket from the load support member and frictionally holding the sample support on the support surface by moving the staple members back to their original position ,
    The clip elements are particularly preferably designed as spring elements for carrying out the method.
    In the following, the invention, together with further advantages, will be explained by way of non-limiting example, which is illustrated in the accompanying drawings. The drawings show:
    1 is a perspective view of a first embodiment of the cartridge according to the invention (version),
    2 is a perspective view of the underside of the cartridge of FIG. 1,
    3 shows a perspective view of a second embodiment of the cartridge according to the invention (version),
    4 is a perspective view of a loading auxiliary element without cartridge inserted,
    5, the loading auxiliary element from FIG. 4 with the inserted cartridge from FIG. 1, FIG.
    5 shows the loading auxiliary element from FIG. 5 with an electron microscope sample carrier eccentrically positioned in the cartridge;
    FIG. 7 shows the loading auxiliary element from FIG. 6, in which the sample carrier in the cartridge is pushed into its holding position, FIG.
    Fig. 8 is a perspective view of a portion of a goniometer with a cartridge mounted therein of Fig. 1, and
    9 is a perspective view of a portion of a goniometer with a cartridge mounted therein of FIG. 3.
    1 shows a cartridge 100 according to the invention for holding an electron microscope sample carrier. The cartridge 100 has a base plate 101, a cover plate 102, an intermediate plate 113 disposed between the base plate 101 and the cover plate, and an aperture 103 extending through a central region of the base plate 101, the intermediate plate 113, and the cover plate 102. The aperture 103 defines in the beam path of the transmission electron microscope a passage for the electron number. The aperture 103 comprises a round aperture region 103a in which the electron microscope sample carrier (not shown), which in the example shown is a grid, is arranged. The aperture 103 further comprises an oblong aperture region 103b, which allows insertion of the sample carrier by means of tweezers. The cartridge 100 further includes two clip members 104a and 104b. The clamp members 104a, 104b are components of the intermediate plate 113, wherein the intermediate plate 113 and the clamp members 104a, 104b are integrally formed. The thickness of the intermediate plate 113 corresponds to the thickness of the clamping elements 104a, 104b. The clip elements 104a, 104b are formed as strip-shaped spring elements which extend on the base plate to the aperture 103 back.
    The base plate 101 also has a contact surface 107 partially surrounding the aperture 103 for an electron microscopic sample carrier. Of course, the support surface 107 can also completely rotate the aperture 103 (not shown). The bearing surface 107 has a first bearing surface area 107a and a larger second bearing surface area 107b. The larger second bearing surface area 107b facilitates the mounting of the sample carrier in the cartridge as will be described in more detail below in FIGS. 4 to 7. The base plate 101 further has an open base plate portion 108 corresponding to the aperture 103. The cover plate 102 has an open cover plate area 109 which is larger than the open base plate area 108 and allows access to the support surface 107 and the clamp elements 104a, 104b. The intermediate plate 113 has at an intermediate portion an open intermediate plate portion substantially corresponding to the open cover plate portion 109, with the clip members 104a, 104b extending into the open intermediate plate portion.
    Each clamp member 104a, 104b has a first end 105a, 105b extending from the intermediate plate 113 and a free, second end 106a, 106b which extends toward the aperture 103. The spring force of the clamping elements 104a, 104b is directed towards the base plate 101. The clip elements 104a, 104b are arranged opposite each other in the example shown. The second ends 106a, 106b terminate with the edge of the support surface 107 at the aperture 103.
    In an alternative embodiment, not shown, but from the PI 1920 shown
    Figures can be derived without further ado, the cartridge no intermediate plate 113, but only a base plate 101 and a cover plate 102 on. Consequently, the first ends 105a, 105b of each clip element 104a, 104b do not extend from the intermediate plate 113 in this alternative embodiment, but are fixed between the base plate 101 and the cover plate 102. In this cartridge composed of two plates, the cover plate is correspondingly elastic. to allow welding to the base plate.
    In the cartridge 100, a base 111, the intermediate plate 113 and the cover plate 102 passing through hole 111 is shown, which serves only as a production aid and the positioning of the plates to each other when they are welded. At the outer edge 100 of the cartridge 100, a web 112 is arranged, which also serves as a production aid. The web 112 is separated after welding from the cartridge.
    The base plate 101, the intermediate plate 113 with the clamping elements 104a, 104b and the cover plate 102 are non-detachably connected to each other by spot welding. In order for the cartridge 100 to have a surface that is as smooth and polished as possible, the individual components can be surface-treated, for example by vibratory grinding (Trowalisie-ren®).
    The cartridge 100 is intended in particular for inclusion in a side-entry goniometer (goniometer with side guide). However, it is also possible to use the cartridge 100 in a top-entry goniometer.
    The cartridge 100 shown in Fig. 1 has an outer edge 110 with a rotationally symmetric configuration corresponding to a fourfold rotational symmetry (90 ° symmetry), which is necessary for certain applications. When the goniometer into which the cartridge 100 is inserted has only one tilt axis, the cartridge 100 may be located outside the transmission electron microscope by a defined angle, i. rotated by 90 °. Consequently, after a successful rotation of the tilt angle in the transmission electron microscope is also rotated by 90 °, which corresponds to a rotation about two vertical axes.
    2 shows a perspective view of the underside of the cartridge 100. The base plate 101 has two openings 120a, 120b extending through the base plate, which are located directly below the clip elements 104a, 104b and allow access to the clip elements 104a, 104b , As will be described below with reference to FIGS. 4 to 7, the staple elements 104a, 104b for inserting the electron microscope sample carrier may be guided by means of pin-shaped engagement elements which are guided from below through the openings 120a, 120b , are raised against their spring force.
    FIG. 3 shows a cartridge 200 which differs from the cartridge 100 shown in FIGS. 1 and 2 in that it has a round outer edge 210. The production aids shown in the cartridge 100 (bore 111, web 112) are not shown in the cartridge 200. The remaining features of the cartridge 200 are analogous to those of the cartridge 100. By means of the cartridge 200, a double tilting can be realized. Consequently, this is particularly suitable for use in a "double-tilt goniometer". Double-tilt goniometers are well known to those skilled in the art.
    The cartridges 100, 200 shown in the examples are dimensioned for the inclusion of a sample carrier in the form of a grid (grid 310, see FIGS. 6 and 7) as mentioned above, since these are the most frequently used in practice. However, it will be apparent to those skilled in the art that the cartridge of the present invention may also be sized for electron microscope specimen slides having a different diameter or shape than the standard grids.
    In the following, FIGS. 4 to 7 show a loading device for loading a cartridge according to the invention with an electron microscope sample carrier and illustrate the loading method.
    The charging device 300 is shown in FIG. 5 and comprises a cartridge according to the invention, which in the example shown is the cartridge 100 described above, as well as a block-shaped loading aid 301. Referring to FIG. 4, the loading aid has a recess 302, which outer shape of the cartridge 100 corresponds and in which this, as shown in FIG. 5, can be inserted. The cartridge 100 can be inserted laterally via a guide 303 into the loading aid 301. A lateral insertion and removal of the cartridge 100 is thereby much easier and more manageable, as if the insertion and removal of the cartridge 100 would have to be done from above. For conveniently grasping the cartridge 100 with a grasping aid, e.g. a tweezers, when inserting and removing the cartridge 100 in the loading aid, the loading aid 301 has a recess 304 arranged in the center of the guide 303. In the recess 302, two pin-shaped engaging elements 305a, 305b are further arranged, the purpose of which will be illustrated below.
    FIG. 5 shows the loading aid 301 with the cartridge 100 inserted therein. The engagement elements 305a, 305b are aligned with the openings 120a, 120b which are located on the underside of the cartridge 100. By lowering the cartridge 100 into the recess 302 of the loading aid 301, the pin-shaped engagement elements 305a, 305b slide into the openings 120a, 120b, thereby lifting the resilient clip members 104a, 104b upwardly away from the support surface 107 to a raised position against their spring force ,
    FIG. 6 shows the loading device 300 with a grid 310 positioned on the larger second contact surface area 107b of the cartridge 100. The grid 310 is initially in an eccentric position (designated by the reference numeral 311), ie next to the actual holding position, in which the grid 310 is held in the cartridge. In the next step, the grid 310 is laterally displaced in the direction of the first contact surface area 107a, so that it, as shown in FIG. 7, now in the holding position (indicated by reference numeral 312) on the first support portion 107a of the cartridge 100 and below which is located in the raised position clamping elements 104a, 104b. By lifting the cartridge 100, the clip members 104a, 104b spring back to their original position and hold the grid 310 at its edge portions 313a, 313b so as to be securely fixed in the cartridge 100. As can be clearly seen from Fig. 7, the edge portions 313a, 313b are spaced apart. The method illustrated in FIGS. 4 to 7 enables a stable and stress-free mounting and mounting of the grid 310. In addition, a very good thermal contact between the grid 310 and the cartridge 100 is ensured. Since the grid 310 is held only on two edge regions 313a, 313b in the cartridge 100, a large tilt angle is possible. After fixing the grid 310 in the cartridge 100, the cartridge 100 can be removed from the loading aid 301 and mounted in a goniometer.
    The method shown in FIGS. 3 to 7 can be carried out analogously with the cartridge 200 from FIG. 3 or with each cartridge according to the invention. The recess in the loading aid in this case, of course, to make the dimensions of the respective cartridge accordingly.
    FIG. 8 shows part of a goniometer 400 with a cartridge 100 received therein (shown in the figure without an electron microscope sample carrier). The intended for receiving the cartridge 100 receiving portion 401 of the goniometer 400 is fork-shaped. The cartridge 100 is placed on elongated support surfaces 402 of the receiving area 401 and fixed by means of two resilient brackets 403 on the goniometer.
    Analogous to FIG. 8, FIG. 9 shows a goniometer 500 with a cartridge 200 with a round outer edge received therein, the resilient clamps for holding the cartridge
    P11920; 200 in the fork-shaped receiving portion 501 of the goniometer 500 are not shown.
    Other mechanisms for holding a cartridge (socket) for a sample carrier in a goniometer are known in the prior art. A person skilled in the art will therefore be able to design the cartridge according to the invention such that these mechanisms are also applicable to a cartridge according to the invention. For example, the mechanism shown in EP 1 947 675 A1 is also suitable for a cartridge according to the invention. The goniometer described in EP 1 947 675 A1 has a fork-shaped receiving region which comprises two rods aligned in parallel. The rods engage in a, the outer edge of the cartridge circumferential groove and fix the cartridge in this way in the goniometer. This holding mechanism would also be feasible for the cartridge according to the invention. For this purpose, the cartridges 100, 200 shown in the examples would be provided with a groove running around the outer edge of the cartridge (not shown). As another example, at this point again the double-tilt goniometer, in which the cartridge is pivotally mounted in two axes lying in the sample support plane (see WO 00/10191). Other known goniometers allow tilting of the cartridge only about an axis.
    The above-described implementations of the invention are only examples of many, and thus are not to be considered as limiting.
    Vienna, 2 3, Nov. 2010
    权利要求:
    Claims (20)
    [1]
    Claims 1- version (100,200) for holding an electron microscope sample carrier (310) having a base plate (101) in a central region of the base plate (101) extending through this opening (103) and the opening (103) at least partially encircling support surface (107) for the sample carrier (310), wherein on the base plate (101) a holding device (104a, 104b) for frictionally holding the sample carrier (310) on the support surface (107) is provided, characterized in that the holding device (104a , 104b) for the force-locking holding of the sample carrier (310) at least two mutually independent clamping elements (104a, 104b) extending from the base plate (101) to the opening (103) and by means of which spaced-apart edge regions (313a, 313b) of the Electron microscopic sample carrier (310) on the support surface (107) are durable.
    [2]
    2. Socket according to Claim 1, characterized in that the holding device comprises exactly two clamping elements (104a, 104b).
    [3]
    3. Socket according to claim 2, characterized in that the clamping elements (104a, 104b) are arranged opposite each other.
    [4]
    4. Socket according to one of claims 1 to 3, characterized in that the clamping elements (104a, 104b) are strip-shaped and arranged substantially parallel to the base plate (101).
    [5]
    5. Socket according to one of claims 1 to 4, characterized in that the clamping elements (104a, 104b) are designed as spring elements.
    [6]
    6. Socket according to one of claims 1 to 5, characterized in that each clamping element (104a, 104b) on the base plate (101) fixed first end (105a, 105b) and an opening (103) oriented towards the second end (106a , 106b) for frictionally holding the sample carrier (310) on the support surface (107). -16- * · PI1920
    [7]
    7. Socket according to claim 6, characterized in that the second end (106a, 106b) of the clamping element (104a, 104b) with the edge of the support surface (107) at the opening (103) closes.
    [8]
    8. Socket according to one of claims 1 to 7, characterized by a on the base plate (101) arranged cover plate (102), wherein the cover plate (102) in a central region an open, the access to the sample carrier (310) and to the clamping elements ( 104a, 104b) enabling area (109).
    [9]
    9. Socket according to claim 8, characterized in that the first end (105a, 105b) of each clamping element (104a, 104b) between the base plate (101) and the cover plate (102) is fixed.
    [10]
    10. Socket according to claim 8, characterized by a between the base plate (101) and the cover plate (102) arranged intermediate plate, wherein the clamping elements (104 a, 104 b) are components of the intermediate plate.
    [11]
    11. Socket according to one of claims 8 to 10, characterized in that the open area (109) in the cover plate (102) has a size which allows an eccentric insertion of the sample carrier (310), wherein the sample carrier (310) in addition to that Position (312), in which the sample carrier (310) in the socket (100,200) is durable, inserted into the socket (100,200) and then into the position (312), in which the sample carrier (310) in the socket (100,200) is durable, laterally displaceable.
    [12]
    12. Socket according to one of claims 1 to 11, characterized in that below one of each clamping element (104a, 104b) through the base plate (101) extending therethrough opening (120a, 120b) is arranged.
    [13]
    13. Socket according to one of claims 1 to 12, characterized in that the socket (100) has an outer edge (110) with a rotationally symmetrical design corresponding to a fourfold rotational symmetry.
    [14]
    14. Socket according to one of claims 1 to 12, characterized in that the socket (200) has a substantially round outer edge (210).
    [15]
    15. Socket according to one of claims 1 to 14, characterized in that it is receivable in a specimen holder device (400,500) for an electron microscope. * · • · · · · · ^ 11920
    [16]
    16. A loading device (300) for loading a holder (100, 200) with an electron microscope sample carrier, comprising: - a holder (100, 200) according to one of claims 1 to 15 and - a loading auxiliary element (301) into which the holder (100, 200) can be inserted wherein the loading auxiliary member (301) has engagement members (305a, 305b) extending through the openings (120a, 120b) disposed beneath each clip member (104a, 104b) in the base plate (101) of the socket (100, 200) and which move the clamp members (104a, 104b) of the socket (100, 200) against their holding force in a direction away from the base plate (101).
    [17]
    17. A method for loading a socket (100, 200) with an electron microscopic sample carrier (310) by means of a loading device (300) according to claim 16, comprising the steps: a) inserting the socket (100, 200) into the loading auxiliary element (301), b) moving the Clamping elements (104a, 104b) by means of the engaging elements (305a, 305b) of the loading auxiliary element (301) in a direction away from the base plate (101) in a raised position, c) placing the sample carrier (310) on the supporting surface (107) the socket (100, 200), and d) removing the socket (100, 200) from the load support member (310) and frictionally holding the sample support (310) on the support surface (107) by returning the clamp members (104a, 104b) to their original position.
    [18]
    A specimen holder device (400, 500) for an electron microscope comprising a releasably receivable socket (100, 200) according to any one of claims 1 to 14 or 15.
    [19]
    19. Preparation device according to claim 18 in the form of a goniometer, in particular a side-entry goniometer.
    [20]
    20. Preparation device according to claim 18 or 19, characterized in that the socket is tiltably mounted about at least one axis lying in the sample support plane, preferably about two axes lying in the sample support plane. Vienna, the 2v. i-.ov, 2010
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    同族专利:
    公开号 | 公开日
    EP2458616B1|2018-03-28|
    JP2012119315A|2012-06-21|
    EP2458616A3|2013-11-27|
    AT510799B1|2012-12-15|
    US20120132828A1|2012-05-31|
    US8395130B2|2013-03-12|
    EP2458616A2|2012-05-30|
    JP5588424B2|2014-09-10|
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    法律状态:
    2021-07-15| MM01| Lapse because of not paying annual fees|Effective date: 20201129 |
    优先权:
    申请号 | 申请日 | 专利标题
    ATA1986/2010A|AT510799B1|2010-11-29|2010-11-29|MOUNTING FOR AN ELECTRONIC MICROSCOPIC SAMPLE CARRIER|ATA1986/2010A| AT510799B1|2010-11-29|2010-11-29|MOUNTING FOR AN ELECTRONIC MICROSCOPIC SAMPLE CARRIER|
    EP11190301.9A| EP2458616B1|2010-11-29|2011-11-23|Holder for an electron microscopic sample carrier|
    JP2011259339A| JP5588424B2|2010-11-29|2011-11-28|Cage for sample carrier for electron microscopy|
    US13/304,711| US8395130B2|2010-11-29|2011-11-28|Holder for an electron microscopy sample carrier|
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